Preface Introduction José Machado da Silva Glossary Part I ADC Characterisation B ased On SinewaVe Analysis 1 ADC Applications，Architectures and Terminology José Machado da Silva，Hélto Mendoneca 1.Introduction 2.ADCs’applications 3.ADCs’architectures 4.Terminology 5.Quantisation and A／D conVersion 6.Output coding 7.EI.rors，non-linearity，noise，and distortion 8.Data acquisition and proces sing 9.Input characteristics 2 SinewaVe Test Setup Pierre-Yves Roy，Jacques Dtlrand 1.Test Setup description 2.Specification of the clock and input signal 3.Example of filter specification 4.Filter selection 5.Taking a record of data 3 Time-Domain Data Analysis Dominique Dallet，Djamel Haddadi，Philippe MnrChegay 1.Introduction 2.Calculation of the dynamic parameters 3.Definitions 4.The fixed-frequency method 5.The four-parameter method 6.Definitions of THD and SNR 7.The multi-harmonic sine-wave fitting method 8.Estimation of the normalised angular frequency 9.Esti mation of the linear parameters 10.0n the rank of EP 11.The al gorithm 12.Multitone test to circumvent signal purity problems 4 Frequency-Domain Data AnalVsis Pierre-Yves Roy，Jacques Durand 1.Discrete Fourier Transform and Fast Fourier Transform 2.Choice of input and clock frequencies 3.Windowing 4.Comment on the accuracy of the input frequency 5.Record size 6.Calculation of ADC dynamic parameters in the frequency domain 5 Code Histogram Test Giovanni Chiorboli, Carlo Morandi 1.Introduction 2.The sampling strategy and its contribution to count variance and measurement uncertainty 3.Additional contributions to count uncertaintv：additive noise and jitter 4.Factors affecting the p.d.f.of the input signal 5.Required record length and number of records，expression of measurement uncertainty 6.Choice of the coverage factor 7.Comparing the number of samples required by random and by synchronous sampling. 8.Determining the transfer characteri stic 9.Offset error and gain 10.Linearitv errors 11.Appendix 6 Comparative Study of ADC Sinewave Test Methods JoséMachado da Silva, Hélio Mendonca, Sara Mazoleni 1.Introduction 2.General considerations 3.Simulation results 4.ATE Implementation 5.Conclusions Part II MPasurement of Additinnal Parameters 7 Jitter Measurement Pierre-Yves Roy, Jacques Durand 1.Introduction 2.The double beat technique 3.The joint probability technique 4.Conclusion 8 Differential Gain and Phase Testing JoséMachado da Silva, Hélio Mendonca 1.Introduction 2.Test setup and hardware requirements 3.Analvsis 4.Test results 5.Calculation of diflferential gain and phase from the test results 9 Step and Transient Response Measurement Giovanni Chiorboli, Carlo Morandi 1.Introduction 2.Settling time and transition duration of step response 3.Frequency response measurement 1O Hvsteresis Measurement Giovanni Chiorboli, Carlo Morandi 1.Introduction 2.Test conditions 3.A Dractical case 4.Collection of samples in H(C↑) and H(C↓) 5.Some warning References Index
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